Ruud Tromp
Emeritus hoogleraar Fysica van oppervlakken en materialen
- Naam
- Prof.dr.ir. R.M. Tromp
- tromp@physics.leidenuniv.nl
Nieuws
-
De hersenen beter in beeld - neurale paden zichtbaar gemaakt -
Gestapeld grafeen spiegelt elektronenbundels -
Nieuwe transmissiemicroscoop voor elektronen met lage energie -
Elektronen geven resistlaag elektrische lading -
Nieuw boek over geschiedenis elektronmicroscopie met aandacht voor Leidse natuurkunde -
Beach workshop: ‘So you have a degree in Science. Now what?’
Oud-promovendi
Emeritus hoogleraar Fysica van oppervlakken en materialen
- Wiskunde en Natuurwetenschappen
- Leiden Instituut Onderzoek Natuurkunde
- LION - Quantum Matter & Optics
Contact
- Pennington C.A., Gaowei M., Echeverria E.M., Evans-Lutterodt K., Galdi A., Juffmann T., Karkare S., Maxson J., Molen S.J. van der, Saha P., Smedley J., Stam W.G. & Tromp R.M. (2025), A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates, APL Materials 13(1): 011120.
- Mondal K.P., Gaowei M., Echeverria E., Evans-Lutterodt K., Jordan-Sweet J., Juffmann T., Karkare S., Maxson J., Molen S.J. van der, Pennington C., Saha P., Smedley J., Stam W.G. & Tromp R.M. (2025), Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources, Scientific Reports 15: 3421.
- Neu P.S., Krasovskii E.E., Tromp R.M. & Molen S.J. van der (2025), Bi-directional LEEM and eV-TEM spectroscopy on a graphene-hBN heterostack, Ultramicroscopy 271: 114117.
- Jobst J., Krasovskii E.E., Ribeiro R., Jong T.A. de, Dean C.R., Tromp R.M. & Molen S.J. van der (2025), Unoccupied bands in the molybdenum dichalcogenides MoS2, MoSe2, and MoTe2, Physical Review B 112: 125422.
- Wildenberg G., Boergens K. M., Lambert L., Li R., Craig A., Man M. K. L., Moradi A., Rieger J., Duan H., Dhesi S. S., Karras G., Maccherozzi F., Dani K., Tromp R., Molen S. J. van der, King S. B. & Kasthuri N. (2025), Photoemission electron microscopy for connectomics, Proceedings of the National Academy of Sciences 122(48): e2521349122.
- Stam W.G., Gaowei M., Echeverria E.M., Evans-Lutterodt K., Jordan-Sweet J., Juffmann T., Karkare S., Maxson J., Molen S.J. van der, Pennington C., Saha P., Smedley J. & Tromp R.M. (2024), Growth of ultra-flat ultra-thin alkali antimonide photocathode films, APL Materials 12: 061114.
- Gaowei M., Evans-Lutterodt K., Acevedo-Esteves R., Jordan-Sweet J., Mondal K.P., Walsh J., Saha P., Pavlenko P., Smedley J., Pennington C., Echeverria E., Maxson J., Bahhacharyya P., Karkare S., Stam W.G., Molen S.J. van der, Juffmann T. & Tromp R.M. (2024), Pulsed laser deposition assisted growth of alkali-based photocathodes . Pilat F., Fischer W., Saethre R., Anisimov P. & Andrian I. (red.), Proceedings: 15th International Particle Accelerator Conference (IPAC 2024) . 15th International Particle Accelerator Confernce (IPAC'24) 19 mei 2024 - 24 mei 2024 2057-2059.
- Neu P.S., Siskins M., Krasovskii E.E., Tromp R.M. & Molen S.J. van der (2023), Electron transmission and mean free path in molybdenum disulfide at electron-volt energies, Physical Review B: Condensed Matter 107(7): 075427.
- Jong T.A. de, Visser L., Jobst J., Tromp R.M. & Molen S.J. van der (2023), Stacking domain morphology in epitaxial graphene on silicon carbide, Physical Review Materials 7(3): 034001.
- Tebyani A., Tromp R.M. & Molen S.J. van der (2023), Critical role of electronic states above the vacuum level in photoelectron and secondary electron emission in few-monolayer pentacene films, Physical Review B 108(4): 045425.
- Neu P.S., Geelen D., Tromp R.M. & Molen S.J. van der (2023), Extracting transverse electron mean free paths in graphene at low energy, Ultramicroscopy 253: 113800.
- Moradi A., Rog M., Stam W.G., Tromp R.M. & Molen S.J. van der (2023), Back illuminated photo emission electron microscopy (BIPEEM), Ultramicroscopy 253: 113809.
- Tebyani A., Schramm S.M., Hesselberth M.B.S., Boltje D.B., Jobst J., Tromp R.M. & Molen S.J. van der (2023), Low energy electron microscopy at cryogenic temperatures, Ultramicroscopy 253: 113815.
- Jong T.A. de, Chen X., Jobst J., Krasovskii E.E., Tromp R.M. & Molen S.J. van der (2023), Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide. arXiv. [working paper].
- Jong T.A. de, Benschop T., Chen X., Krasovskii E., Dood M.J.A. de, Tromp R.M., Allan M.P. & Molen S.J. van der (2022), Imaging moiré deformation and dynamics in twisted bilayer graphene, Nature Communications 13: 70.
- Jong T.A. de, Visser L., Jobst J., Tromp R.M. & Molen S.J. van der (2022), Stacking domain morphology in epitaxial graphene on silicon carbide. arXiv. [working paper].
- Jong T.A. de, Benschop T., Chen X., Tromp R.M., Dood M.J.A. de & Allan M.P. Molen S.J. van der (2021), LEEM and the magic of twisted bilayer graphene. Physics@Veldhoven 2021, Veldhoven. 18 januari 2021 - 20 januari 2021. [conferentie poster].
- Neu P.S., Geelen D., Thete A., Tromp R.M. & Molen S.J. van der (2021), Complementary LEEM and eV-TEM for imaging and spectroscopy, Ultramicroscopy 222: 113199.
- Marchand R., Sachl R., Kalbac M., Hof M., Tromp R.M., Amaro M., Molen S.J. van der & Juffmann T. (2021), Optical near-field electron microscopy, Physical Review Applied 16(1): 014008.
- Tebyani A., Baalbergen F.B., Tromp R.M. & Molen S.J. van der (2021), Low-energy electron irradiation damage in few-monolayer pentacene films, The Journal of Physical Chemistry C 125(47): 26150-26156.
- Jong T.A. de, Kok D.N.L., Torren A.J.H. van der, Schopmans H., Tromp R.M., Molen S.J. van der & Jobst J. (2020), Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis, Ultramicroscopy 213: 112913.
- Bespalov I., Zhang Y., Haitjema J., Tromp R.M., Molen S.J. van der, Brouwer A.M., Jobst J. & Castellanos S. (2020), The key role of very-low-energy-electrons in tin-based molecular resists for extreme ultraviolet nanolithography, ACS Applied Materials and Interfaces 12(8): 9881-9889.
- Jobst J., Boers L.M., Yin C., Aarts J., Tromp R.M. & Molen S.J. van der (2019), Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate, Ultramicroscopy 200: 43-49.
- Geelen D., Jobst J., Krasovskii E.E., Molen S.J. van der & Tromp R.M. (2019), Nonuniversal transverse electron mean free path through few-layer graphene, Physical Review Letters 123(8): 086802.
- Jong T.A. de, Jobst J., Krasovskii E.E., Molen S.J. van der, Ott C., Scholma D. & Tromp R.M. (2018), Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation (data file and codebook): 4TU.Centre for Research Data. [dataset].
- Jong T.A. de, Krasovskii E.E., Ott C., Tromp R.M., Molen S.J. van der & Jobst J. (2018), Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation, Physical Review Materials 2(10): 104005.
- Jobst J., Kautz J., Mytiliniou M., Tromp R.M. & Molen S.J. van der (2017), Low-energy electron potentiometry, Ultramicroscopy 181: 74-80.
- Thete A., Geelen D., Molen S.J. van der & Tromp R.M. (2017), Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation, Physical Review Letters 119(26): 266803.
- Jobst J., Torren A.J.H. van der, Krasovskii E.E., Balgley J., Dean C.R., Tromp R.M. & Molen S.J. van der (2016), Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy, Nature Communications 7: 13621.
- Kautz J., Janssen V.A.E.C., Tromp R.M. & Molen S.J. van der (2015), Differential reactivity of alkanethiols with Si, (111)–Au 2D surface alloys, Surface Science 632: L18-L21.
- Jobst J., Kautz J., Geelen D., Tromp R.M. & Molen S.J. van der (2015), Nanoscale measurements of unoccupied band dispersion in few-layer graphene, Nature Communications 6: 8926.
- Kautz J., Jobst J., Sorger C., Tromp R.M., Weber H.B. & Molen S.J. van der (2015), Low-Energy Electron Potentiometry: Contactless Imaging of Charge Transport on the Nanoscale, Scientific Reports 5: 13604.
- Kautz J., Copel M.W., Gordon M.S., Tromp R.M. & Molen S.J. van der (2014), Titration of submonolayer Au growth on Si(111), Physical Review B: Condensed Matter 89(3): 035416.
- Schramm S., Molen S.J. van der & Tromp R.M. (2012), Intrinsic Instability of Aberration-Corrected Electron Microscopes, Physical Review Letters 109(16): 163901.
- Tromp R.M., Wan W. & Schramm S. (2012), Aberrations of the Cathode Objective Lens up to Fifth Order, Ultramicroscopy 119: .
- Schramm S., Pang A.B., Altmann M. & Tromp R.M. (2012), A Contrast Transfer Function Approach for Image Calculations in Standard and Aberration-Corrected LEEM and PEEM, Ultramicroscopy 115: .
- Schramm S., Kautz J., Berghaus A., Schaff O., Tromp R.M. & Molen S.J. van der (2011), Low Energy Electron Microscopy and Spectroscopy with ESCHER: Status and Prospects, IBM Journal of Research and Development 55: 1:1-1:7.
- Sikharulidze I., Gastel R. van, Schramm S., Abrahams J.P., Poelsema B., Tromp R.M. & Molen S.J. van der (2011), Low energy electron microscopy imaging using Medipix2 detectors, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment 633(Supplement 1): S239-S242.
- Gastel R. van, Molen S.J. van der & Tromp R.M. (2010), Oppervlakken filmen met trage elektronen, Nederlands Tijdschrift voor Natuurkunde oktober: 332-336.
- Gastel R. van, Sikharulidze I., Schramm S., Abrahams J.P., Poelsema B., Tromp R.M. & Molen S.J. van der (2009), Medipix 2 detector applied to low energy electron microscopy, Ultramicroscopy 110(1): 33-35.
- Frenken J.W.M., Tromp R.M. & Veen J.F. van der (1986), Theory and simulation of high-energy ion scattering experiments for structure analysis of surfaces and interfaces, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 17(4): 334-343.
- Research staff member at IBM USA