Jonathon Cottom
Onderzoeker
- Naam
- Dr. J.P. Cottom
- ORCID iD
- 0000-0002-5918-9464
Oud-promovendi
Onderzoeker
Contact
- Hückmann L., Sylvia R., Blankenvoorde F., Cottom J.P. & Meyer J. (2026), Mechanistic insights into the dry oxidation of amorphous silicon nitride: a DFT study, Journal of Materials Chemistry C 14(1): 139-151.
- Cottom J.P., Hückmann L., Meyer J. & Olsson E. (2025), Forged by charge: polaron-induced matrix formation in silicon nitride conversion-type anodes for lithium-ion batteries, Journal of Materials Chemistry A 13(40): 34260-34272.
- Cottom J.P., Hückmann L., Olsson E. & Meyer J. (2024), From Jekyll to Hyde and beyond: hydrogen’s multifaceted role in passivation, H-induced breakdown, and charging of amorphous silicon nitride, Journal of Physical Chemistry Letters 15(3): 840-848.
- Cottom J.P., Vliet S. van, Meyer J., Bliem R. & Olsson E. (2024), Coverage-dependent stability of RuxSiy on Ru(0001): a comparative DFT and XPS study, Physical Chemistry Chemical Physics 26(46): 28793-28799.
- Cottom J.P., Vliet S. van, Meyer J., Bliem R. & Olsson E. (2024), Coverage-dependent stability of RuxSiy on Ru(0001): a comparative DFT and XPS study. Physical Chemistry Chemical Physics 26: Zenodo: 28793–28799. [dataset].
- Hückmann L., Cottom J.P. & Meyer J. (2023), Intrinsic charge trapping and reversible charge induced structural modifications in a‐Si3N4, Advanced Physics Research 3(2): 2300109.
- Hückmann L., Cottom J.P. & Meyer J. (2023), Intrinsic charge trapping and reversible charge induced structural modifications in a-Si3N4. [dataset].