Vladyslav Andriiashen is a postdoctoral researcher at the Leiden Institute of Advanced Computer Science (LIACS). He received the M.Sc. degree in applied physics and mathematics from the Moscow Institute of Physics and Technology in 2019, and the Ph.D. degree at Eindhoven University of Technology in 2025. His Ph.D. research, performed at CWI, was focused on X-ray image generation for machine learning and system design for industrial applications. His current research focuses on multimodal inspection systems for industrial applications combining X-ray imaging and photogrammetry, data simulation, and methods for multimodal image analysis.